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Fixed-charge examination by surface energy measurement
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This work is deal with development of alternative method measuring fixed charge in thin dielectric layers by surface tension. Presence fixed charge takes effect so-called Back Surface Field (BFS), which helps to decrease surface recombination velocity on back side of solar cell. In work is described experimental measuring on dielectric layers Al2O3, AlN, SiNx, Y2O3 and PSG deposit on crystalline silicon wafers. Surface tension (it is the same like surface free energy) is analyzed from contact angle size using See System.
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Surface free energy of plasma polymers
Klepáčková, Barbora Bella ; Dzik, Petr (referee) ; Čech, Vladimír (advisor)
Tato práce se zabývá studiem změn volné povrchové energie organokřemičitých plasmových polymerů na základě jejich rozdílných depozičních podmínek. Výpočet volné povrchové energie byl proveden pomocí Owens-Wendt-Kaelble, Wu a acido-bazické teorie. K měření kontaktních úhlů bylo použito čtyř různých testovacích kapalin (voda, formamid, dijodmethan a glycerol). Pro tenké vrstvy plasmového tetravinylsilanu připraveného s efektvním výkonem 2, 10, 25, 70 a 150 W byla naměřená volná povrchová energie mírně vzrůstající.
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Self-assembled layers based on silicon
Bábík, Adam ; Veselý, Michal (referee) ; Čech, Vladimír (advisor)
Thin film deposition, characterization and properties of self-assembled monolayers based on silicon were studied with emphasis on the SA monolayers deposited from vinyltriethoxysilane and vinyltrichlorsilane. The thesis is aimed at basic properties of the SA monolayer and explanation of its growth. Methods and techniques used for analysis of the monolayer were described as well. Contact angle measurements and an evaluation of the surface free energy are depicted in details. The deposited SA layers were observed with respect to their chemical composition and surface morphology by X-ray photoelectron spectroscopy (XPS), ellipsometry and atomic force microscopy (AFM).
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Plasmachemical preparation of polymer layers based on 2-ethyl-2-oxazoline and their diagnostics
Podzemná, Erika ; Menčík, Přemysl (referee) ; Mazánková, Věra (advisor)
The bachelor’s thesis deals with deposition of thin polymer layers on 2-ethyl-2-oxazolin basis in a dielectric barrier discharge in a nitrogen atmosphere. Polyoxazolines are characterized by good antibacterial effects in general, which make them a suitable material for medical applications. After preparing of the layers. Their properties were studied using three methods. The first were antibacterial tests, which unfortunately did not confirm the above written properties. Furthermore, the free surface energy of the layers, from which it could be inferred that the surfaces were hydrophilic, was determined by measuring contact angles. The scanning electron microscopy showed the surface of the layers as well as the elemental composition thanks to the connected X-ray detector.
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Plasmachemical preparation of polymer layers based on 2-ethyl-2-oxazoline and their diagnostics
Podzemná, Erika ; Menčík, Přemysl (referee) ; Mazánková, Věra (advisor)
The bachelor’s thesis deals with deposition of thin polymer layers on 2-ethyl-2-oxazolin basis in a dielectric barrier discharge in a nitrogen atmosphere. Polyoxazolines are characterized by good antibacterial effects in general, which make them a suitable material for medical applications. After preparing of the layers. Their properties were studied using three methods. The first were antibacterial tests, which unfortunately did not confirm the above written properties. Furthermore, the free surface energy of the layers, from which it could be inferred that the surfaces were hydrophilic, was determined by measuring contact angles. The scanning electron microscopy showed the surface of the layers as well as the elemental composition thanks to the connected X-ray detector.
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Smáčivost povrchu dřeva kapalinami v závislosti na jeho drsnosti
Kořínek, Zdeněk
This work discusses about the problems of surface properties of wood. Specifi-cally engaged wettability depending on the influence of mechanical processing concrete-ly on the influence of rotational speed of the speed during milling of the oak wood. And the experimental determination of contact angle and the surface free energy according to the methodology of Liptakova and Kudela. From the measurements it was found, that the impact speed of the rotation of the tool causes increase a speed and increase of contact angle and decrease the surface ener-gy and vice versa. The main question remains a factor that causes this effect, because the roughness measurement was no indication the main factor that would influence this is-sue. The values of the surface energy of wood ranges from 59 to 82 mJ/m2 in all the measured speeds.
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Surface free energy of plasma polymers
Klepáčková, Barbora Bella ; Dzik, Petr (referee) ; Čech, Vladimír (advisor)
Tato práce se zabývá studiem změn volné povrchové energie organokřemičitých plasmových polymerů na základě jejich rozdílných depozičních podmínek. Výpočet volné povrchové energie byl proveden pomocí Owens-Wendt-Kaelble, Wu a acido-bazické teorie. K měření kontaktních úhlů bylo použito čtyř různých testovacích kapalin (voda, formamid, dijodmethan a glycerol). Pro tenké vrstvy plasmového tetravinylsilanu připraveného s efektvním výkonem 2, 10, 25, 70 a 150 W byla naměřená volná povrchová energie mírně vzrůstající.
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Fixed-charge examination by surface energy measurement
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This work is deal with development of alternative method measuring fixed charge in thin dielectric layers by surface tension. Presence fixed charge takes effect so-called Back Surface Field (BFS), which helps to decrease surface recombination velocity on back side of solar cell. In work is described experimental measuring on dielectric layers Al2O3, AlN, SiNx, Y2O3 and PSG deposit on crystalline silicon wafers. Surface tension (it is the same like surface free energy) is analyzed from contact angle size using See System.
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